Continuous Electron Beam Accelerator Books
Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry
Author: Barry Carter, David Williams
School: Edo University
Department: Science and Technology
Course Code: PBB214
Topics: Transmission Electron Microscopy Diffraction, Imaging, Spectrometry, electron sources, field emission sources, photo-emission sources, direct-detection camera, ultrafast electron microscopy, temperature, electron diffraction, Spinodal alloys, phase identification, Ferritic steels, Convergent-Beam Electron Diffraction, Electron Crystallography, Charge-Density Mapping, Nano diffraction, digital micrograph, digital image processing, electron waves, interference waves, wave propagation, image wave formation, electron wave function, electron inference, Electron Holography, Focal-Series Reconstruction, image interpretation, image formation, electron tomography, density functional theory, X-ray excitation, EELS imaging
Author: Richard Dorf
School: Edo University
Department: Science and Technology
Course Code: PHY213
Topics: Electronics, Power Electronics, Optoelectronics, Microwaves, Electromagnetics, Radar, semiconductors, diodes, semiconductor manufacturing, Microlithography, transistors, Junction Field-Effect Transistors, Bipolar Transistors, Metal-Oxide Semiconductor Field-Effect Transistor, Single Electron Transistors, integrated circuits, integrated circuit technology, Surface Mount Technology, amplifier, signal analysis, active filters, power electronics, Power Semiconductor Devices, power conversion, Lasers, Electromagnetic Fields, magnetism, magnetic fields, magnetic recording, wave propagation, space propagation, wave guides, antennas, Fresnel Zone Plate Antenna, Microwave Devices, Lightning, pulse radar, continuous radar, Electroacoustic Transducers, Ferroelectric Materials, Piezoelectric Materials, Electrostriction, hall effect, superconductivity, dielectric, insulators
Principles of Soil Chemistry, 4th Edition
Author: Kim Tan
School: National Open University of Nigeria
Department: Agriculture and Veterinary Medicine
Course Code: SLM301
Topics: Soil Chemistry, analytical chemistry, geochemistry, Particle Accelerators, Synchrotrons, Stanford Linear Accelerator, Continuous Electron Beam Accelerator, Fermi National Laboratory Accelerator, Brookhaven Realistic Heavy Ion Collider, quarks, leptons, Atomic Numbers, Avogadro’s Number, atomic orbitals, Acid–Base Titrations, Precipitation, Complex Reactions, Chemical Units, Molarity, Molality, Radioactivity, isotopes, mole fractions, Soil Composition, Electrochemical Potentials, carbon dating, Electrochemical Cells, Nernst Equation, Electron Activity, chemical potential, membrane potential, Soil Gas, Oxygen Revolution, soil aeration, soil aerification, Soil Air Quality, Hydrotropism, Hypoxia, soil water chemistry, Oxygen Demand of Water, Total Soil Water Potential, Matric Potential, Pressure Potential, Osmotic Potential, Gravitational Potential, Plant–Soil–Water Energy Relation, water dissociation, Colloidal Chemistry, Colloidal System, soil humus, Carbohydrates, Amino Acids, Peptides, Proteins, Nucleic Acids, lipids, Lignins, humic matter, Electron Microscopy, Clay Minerals, Surface Potential, Electric Double Layer, Helmholtz Double-Layer Theory, Gouy–Chapman Double-Layer Theory, Adsorption Isotherms, soil adsorption, water adsorption, Cation Exchange, Cation Exchange Reactions, Cation Exchange Capacity, Langmuir–Vageler Equation, Mono-Divalent Cation Exchange Reaction, Mono-Monovalent Cation Exchange Reaction, Anion Exchange, Phosphate Retention, Phosphate fixation, Phosphate Potential, Soil Reaction, Acid–Base Chemistry, Weathering, Coordination Theory, Complex Formation, chelation, Metal–Organic Complex Reactions, Clay–Organic Compound Complexes
Electronics &electronics measurements & instrumentation
Author: prithwiraj purat, budhadutya biswas, santanu das, chirank
School: Federal University of Technology, Owerri
Department: Engineering
Course Code: ECE302
Topics: concept of measurement systems, analog meters, instrument transformers, measurement of resistance, potentiometers, ac bridges
Technical Electronics Aspects of Security
Author: RA Okunola, AT Adegoke
School: National Open University of Nigeria
Department: Administration, Social and Management science
Course Code: CSS441, CSS747
Topics: E-Security, Electronic Risks, Risk Management Framework, Electronic Document Security, Electronic Security, Electronic Voting System, Electronic Banking, Electronic Data Interchange Messaging Security, Information Security
Strength of Material, Second Edition
Author: SS Rattan
School: Bayero University, Kano
Department: Engineering
Course Code: CIV3308
Topics: Simple stress, simple strain, Shear stress, Saint-Venant's principle, Stress, strain, Modulus of elasticity, Modulus of Rigidity, Bar elongation, Superposition principle, Tapering section Bars, Elongation due to self-weight, Uniform strength column, Statically indeterminate systems, Temperature stresses, Shrinking on, Strain analysis, Tensile test diagram, Elastic constants, Three-Dimensional stress systems, Compound stress, compound stress, Principal stresses, Maximum shear stresses, Mohr's Stress cycle, Three coplanar stress, Ellipse of Stress, Strain Analysis, Principal Strain, Principal shear strain, Mohr's Strain cycle, Strain Energy, Shear force, Bending moment, Supports types, Bending stress in beams, Simple bending theory, Moment of inertia, Flitched beams, composite beams, Unsymmetrical bending, Ellipse of inertia, Shear stress in beams, Shear stress variation, Built-up beams, Shear centre, Deflection, Beam differential equation, Deflection at a point, Macaulay's method, Moment-Area method, Strain energy due to bending, Castigliano's First theorem, Deflection by castigliano's Theorem, Impact loading on beams, conjugate beam method, Betti's reciprocal deflections theorem, Maxwell's Reciprocal Deflection theorem, Fixed beams, Continuous beams, Fixidity Effects, Clapeyron's three moment equation, Torsion, Springs, Columns, Struts, Failure Theories, Plastic bending, Plane frame structures, Materials properties, Materials testing, Tensile testing, Compression testing, Torsion testing, Hardness testing, Impact testing, Fatigue testing
Properties and strength Of Materials
Author: Muhannad Zedan
School: Bayero University, Kano
Department: Engineering
Course Code: CIV3308
Topics: strength Of Materials, Simple stress, simple strain, Elastic materials, Hooke's law, Modulus of elasticity, Young's modulus, Brittle materials, Poisson's ratio, Shear stress, Modulus of rigidity, Double shear, Temperature stresses, Compound bar, Cantilever beams, Simple beams, Shear force, bending moment, Shear force diagram, bending moment diagram, Torsion, Crystalline structure, Metals crystalline structure, Atomic bonding, crystal structure, Body-centered cubic structure, Face-centered cubic structure, Hexagonal close-packed structure, grain structure, grain boundary, polymorphism, Slope of beams, deflection of beams, Fatigue, creep, Fracture, Creep test, Fracture mechanics, Linear fracture mechanics, Griffith's fracture criterion
Semiconductor Physical Electronics, 2nd edition
Author: Sheng Li
School: Edo University
Department: Engineering
Course Code: EEE315
Topics: Semiconductor, solids, crystal structure, lattice dynamics, semiconductor statistics, Energy Band Theory, Bloch–Floquet Theorem, Kronig–Penney Model, Band-to-Band Radiative Recombination, Band-to-Band Auger Recombination, Charge-Neutrality Equation, Haynes–Shockley Experiment, Photoconductivity Decay Experiment, Impurity Scattering, Phonon Scattering, p-n Junction Diodes, photoelectric effects, solar cells, photodetectors, light-emitting devices, Bipolar Junction Transistors, Metal-Oxide-Semiconductor Field-Effect Transistors, Metal–Semiconductor Field-Effect Transistors, High Electron Mobility Transistors, Hot-Electron Transistors, Resonant Tunneling Devices, Transferred-Electron Devices, Advanced Bipolar Junction Transistors, Heterojunction Bipolar Transistors, thyristors, Zener Breakdowns, Avalanche Breakdowns, tunnel diodes, Thermionic Emission Theory, Metal Work Function, Schottky Effect, ideal Schottky contact
Limits and Continuous Functions (Lecture 2)
Author: GC Ezeamama
School: Nnamdi Azikiwe University
Department: Science and Technology
Course Code: MAT102
Topics: Limits, Continuous Functions, continuity, left limit, right limit
Eukaryotic Electron Transport Chains
Author: Igunnu
School: University of Ilorin
Department: Science and Technology
Course Code: BCH210
Topics: Eukaryotic Electron Transport Chains, Eukaryotic Electron Transport Chain
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