Chain Devices Books
Author: Thomas Floyd
School: Federal University of Technology, Owerri
Department: Engineering
Course Code: ECE316
Topics: Diode, transistor, BJT amplifier, amplifier, FET, amplifier frequency response, thryistors, operational amplifier, OP-AMP, filter, oscillator, voltage regulator, programming
Semiconductor Devices (Theory and Application), Version 1.1.5
Author: James fiore
School: Federal University of Technology, Owerri
Department: Engineering
Course Code: ECE411
Topics: Atomic, Crystals, Doped Materials, N-Type Material, P-Type Material, PN Junctions, Diodes, Diode Applications, Bipolar Junction Transistors, BJTs, BJT Biasing, Amplifier, BJT Small Signal Amplifiers, Junction Field Effect Transistors, JFETs, JFET Small Signal Amplifiers, Metal Oxide Semiconductor FETs, MOSFETs, DE-MOSFET, MOSFET Small Signal Amplifiers, Class D Power Amplifiers
Optoelectronics : Devices and Principles 2
Author: Gloria Chukwudebe
School: Federal University of Technology, Owerri
Department: Engineering
Course Code: ECE505
Topics: Light Emitting Diode, Liquid Crystal Display, LASER, optical diode, LEDs Operation, LED, LED fabrication, LED Biasing, LCD
Author: Chiaka
School: University of Ibadan
Department: Science and Technology
Course Code: ZOO114
Topics: Cellular Respiration, ATP, Mitochondria, ATP synthesis, Peter Mitchell
Author: Bryant Miles
School: University of Ibadan
Department: Science and Technology
Course Code: ZOO114
Topics: Mitochondria, NADH, Flavoprotein, coenzyme Q, cytochrome, iron-sulfur protein, copper protein, Q-cycle
Author: physiology
School: University of Nigeria, Nsukka
Department: Medical, Pharmaceutical and Health science
Course Code: PYS
Topics: TCA cycle, Ubiquinone, dehydrogenases, flavin, Fe-S clusters
Managing Risk and Resilience in the Supply Chain
Author: David Kaye
School: National Open University of Nigeria
Department: Administration, Social and Management science
Course Code: ENT421
Topics: Managing Risk, Resilience, modern day business models, business continuity management, business continuity, Third-party relationship management, Managing third parties, benchmarking confidence, gaining confidence
Digital Logic Circuit Analysis and Design
Author: Victor Nelson, Troy Nagle, Bill Carroll, David Irwin
School: Edo University
Department: Engineering
Course Code: EEE314
Topics: Digital Logic Circuit Analysis, Digital Logic Circuit Design, computing, digital systems, number systems, positional notation, arithmetic, binary arithmetic, octal arithmetic, hexadecimal arithmetic, base conversions, signed number representation, computer codes, numeric codes, error detection codes, correction codes, Boolean algebra, Venn diagram, Duality, switching functions, truth tables, switching circuits, electronic logic gates, combinational circuits, algebraic methods, combinational logic circuits, computer aided design, design cycle, digital circuit modelling, design synthesis, logic simulation, Karnaugh maps, Quine-McCluskey tabular minimization method, Petrick's algorithm, computer aided minimization of switching functions. Modular combinational logic, Decodes, encoders, decoder circuit structures, encoders, multiplexers, demultiplexers, data distributors, adder circuits, comparators, semi custom logic devices, logic array circuits, field-programmable logic arrays, programmable read-only memory, programmable array logic, sequential devices, sequential circuits, memory devices, latches, flip-flops, timing circuits, modular sequential logic shift registers, counters, serial adder unit, serial accumulators, parallel accumulators, multiple-sequence counters, digital fractional rate multipliers, synchronous sequential circuit models, synchronous sequential circuits, registered programmable logic device, programmable gate arrays, sequential circuit design, logic circuit testing, digital logic circuit testing, combinational logic circuit testing, sequential logic circuit testing, electronic slot machine, keyless auto entry system
Semiconductor Physical Electronics, 2nd edition
Author: Sheng Li
School: Edo University
Department: Engineering
Course Code: EEE315
Topics: Semiconductor, solids, crystal structure, lattice dynamics, semiconductor statistics, Energy Band Theory, Bloch–Floquet Theorem, Kronig–Penney Model, Band-to-Band Radiative Recombination, Band-to-Band Auger Recombination, Charge-Neutrality Equation, Haynes–Shockley Experiment, Photoconductivity Decay Experiment, Impurity Scattering, Phonon Scattering, p-n Junction Diodes, photoelectric effects, solar cells, photodetectors, light-emitting devices, Bipolar Junction Transistors, Metal-Oxide-Semiconductor Field-Effect Transistors, Metal–Semiconductor Field-Effect Transistors, High Electron Mobility Transistors, Hot-Electron Transistors, Resonant Tunneling Devices, Transferred-Electron Devices, Advanced Bipolar Junction Transistors, Heterojunction Bipolar Transistors, thyristors, Zener Breakdowns, Avalanche Breakdowns, tunnel diodes, Thermionic Emission Theory, Metal Work Function, Schottky Effect, ideal Schottky contact
Introduction to computer science
Author: CPT FUTMINNA
School: Federal University of Technology, Minna
Department: Engineering
Course Code: CPT111
Topics: Computer Generations, computer hardware, computer software, computer memory, Random Access Memory, Read Only Memory, storage devices, input devices, output devices, Operating Systems, utility program, Language Translators
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