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Seismic Refraction Method Past Questions

Operation research

Year: 2020

School: Federal University of Technology, Owerri

Department: Engineering

Course Code: IPE503

Topics: Operation research, linear programming, operations research applications, simplex method

Manufacturing process 3

Year: 2020

School: Federal University of Technology, Owerri

Department: Engineering

Course Code: IPE507

Topics: Manufacturing process, ultrasonic machining, unconventional machining methods, machined surface accuracy, electrochemical machining, powder metallurgy, gear machining, manufacturing gears, electron beam machining, electro discharge machining

Reservoir modelling and simulation

Year: 2020

School: Federal University of Technology, Owerri

Department: Engineering

Course Code: PET505

Topics: Reservoir modelling, reservoir simulation, history matching, history matching optimization, reservoir simulation study process, history matching parameters, oil phase partial differential equation, Gaussian elimination method, finite difference approximation, Taylor series expansion, tri-diagonal matrix, incompressible flow equation

Production and operation management

Year: 2023

School: Air Force Institute of Technology

Department: Administration, Social and Management science

Course Code: BUS307

Topics: Production management, operation management, least cost method transportation problem, inventories

General Engineering Mathematics 3

Year: 2023

School: Air Force Institute of Technology

Department: Engineering

Course Code: GET301

Topics: Engineering Mathematics, Gaussian Elimination method, Eigen Values, Eigen vectors, domain range, Green's theorem, vector valued function derivative, Cauchy-Riemann equations, Cauchy Integral theorem

Crystallography, X-ray and electron microscopy 2014, 2016, 2018, 2019

Year: 2019

School: Federal University of Technology, Owerri

Department: Engineering

Course Code: MME505

Topics: Crystallography, x-ray diffraction, electron microscopy, crystal structure, lattice constant, diffraction methods, camera resolution, Bragg law, crystallographic planes, crystallographic directions, diffractometer detector circuit, Weiss zone law, X-rays characteristics, crystal, symmetrical operation, plane of symmetry, X-ray diffractometer, X-ray spectrometer, optical microscope limit of resolution, linear absorption coefficient, mass absorption coefficient

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General studies

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